Journal of Chaohu University >
An Improved Vague Set Distance Measure and Its Application to Pattern Recognition
Received date: 2020-02-23
Online published: 2020-08-20
Key words: Vague value; distance measure; property; pattern recognition
HU Rui, CHEN Hua-you . An Improved Vague Set Distance Measure and Its Application to Pattern Recognition[J]. Journal of Chaohu University, 2020 , 22(3) : 79 -81+103 . DOI: 10.12152/j.issn.1672-2868.2020.03.011
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