Journal of Chaohu University ›› 2020, Vol. 22 ›› Issue (3): 79-81+103.doi: 10.12152/j.issn.1672-2868.2020.03.011

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An Improved Vague Set Distance Measure and Its Application to Pattern Recognition

HU Rui,CHEN Hua-you   

  1. 1.College of Mathematics and Computer Science, Tongling University 2. School of Mathematical Sciences, Anhui University
  • Received:2020-02-23 Online:2020-05-25 Published:2020-08-18
  • Contact: HU Rui:College of Mathematics and Computer Science, Tongling University, Tongling Anhui 244000
  • About author:HU Rui:College of Mathematics and Computer Science, Tongling University, Tongling Anhui 244000

Abstract: Aiming at the existing methods of Vague set distance measurement, this paper points out that these methods have some defects through specific vague set data. Therefore, a new distance measurement formula for two Vague values is proposed in this paper, which proves that the distance measurement has good properties, such as non-negative, intermediate and triangle inequality. The application of new Vague set distance measure in pattern recognition is illustrated by an example 

Key words: Vague value, distance measure, property, pattern recognition

CLC Number: 

  • TP18